Projects > Test & Analysis > Scanning Electron Microscope

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→ Material Analysis using SEM

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When appropriate, we use outside services to help with special needs. For example, analysis of materials, failed parts, surface wear, etc, may be enhanced by using special tools. For example, the Scanning Electron Microscope (SEM) is a powerful tool for analysis. It provides very high magnification and also identifies material used.

The Scanning Electron Microscope (SEM) uses electrons rather than light to create an image.  The advantages of electrons over light are higher magnification, larger depth of focus, greater resolution, and easy sample observation.

An SEM paired with an energy or wavelength dispersive spectrometer can be used to determine chemical characteristics of materials.  The spectrometer generates a spectrum of x-ray energies that correspond to levels of elements present in the specimen.

• Identify unknown materials
• Quantify elemental composition of a specimen
• Produce images having high resolution and magnification
• Analyze surface contamination
• Evaluate corrosion
• Distinguish material alloys

Contact ISU Materials Science and Engineering Department for further information about how the SEM works.

More Testing & Analysis:

• Cylinder Failure
• Cab Testing
• Finite Element Analysis